Local near-field probing is a powerful technique to study electromagnetic material properties. This workshop brings researchers in microwave, THz, and far-infrared scanning probe microscopy to share breakthroughs in research and create new collaborations.
Meeting Website: https://www.nist.gov/news-events/events/2019/12/high-frequency-scanning-probe-microscopy-workshop
Contact Information:
Steven M. Anlage
E-mail: anlage@umd.edu